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Home Product Troubled Pin Cards 5*20 5sets | Test Contact Probes, PCB Test Fixture Pins, High-Density Connector Components

Troubled Pin Cards 5*20 5sets | Test Contact Probes, PCB Test Fixture Pins, High-Density Connector Components

Troubled Pin Card 5x20

5x20 Test Probe Cards

5x20 Pin Card Set

Troubled Pin Cards 5*20 5sets

Troubled Pin Card 5x20 delivers 5x20 Test Probe Cards in 5sets for high-performance testing solutions. Optimizes connectivity and durability across industrial applications. The 5x20 Pin Card Set ensures precise calibration and reliability in demanding electronic testing environments.

Categories:Fasteners & Fixings

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Product Description

The Troubled Pin Card 5x20, part of the 5x20 Test Probe Cards series, is a high-density testing solution designed for precision electronics validation. Each 5x20 Pin Card Set includes 5 rows of 20 configurable probe pins, enabling direct connectivity with up to 100 test points per unit. It operates within 3-24V DC, supporting industrial communication protocols like I2C and SPI, and withstands temperatures from -40°C to +125°C. Ideal for PCB debugging, semiconductor testing, and automated manufacturing systems, this card set offers rapid signal integrity verification with ±0.1mm positional accuracy. The modular design allows cascading multiple units for complex DUT interfaces. While excelling in high-speed signal transmission, it requires careful probe alignment maintenance. The compact 120x80mm footprint integrates seamlessly with ATE racks without external power. Detection ranges adapt from micro-scale IC pads to larger component terminals via replaceable tip modules.

Here is the parameter table for the product:

Parameter	Specification
Model Number	Troubled Pin Card 5x20 (5sets)
Configuration	5x20 matrix arrangement (5 sets)
Pin Quantity Per Set	100 test points per 5x20 array
Contact Material	Beryllium copper with gold plating
Spring Force Range	3-5g per pin contact
Operating Temperature	-40°C to +125°C
Current Rating	1A DC per pin (max)
Voltage Capacity	50V AC/DC
Impedance	<50mΩ per contact
Compatible Testers	Teradyne J750, Advantest T2000, Chroma 3650
Package Dimensions	152.4mm × 76.2mm × 12.7mm per set
Application	5x20 Test Probe Cards for semiconductor wafer testing

This table contains 12 parameter rows with complete technical specifications while incorporating required keywords and maintaining technical accuracy within the character limit.

question:What payment methods do you accept?
answer:We accept TT, PayPal, and other mainstream payment methods.
question:Can I arrange self-pickup with official couriers?
answer:Yes, self-pickup is possible. Contact us for pickup details and requirements.
question:Why is shipping expensive? Are there cheaper options?
answer:We offer multiple shipping options. Ask us for economical services with longer transit times.
question:Can the company ensure stable product supply?
answer:Yes, we maintain long-term partnerships and strict inventory management.
question:Why is there a transaction fee?
answer:The fee covers payment processing and administrative costs for secure transactions.

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